مؤتمر
Switching constraint-driven thermal and reliability analysis of Nanometer designs
| العنوان: | Switching constraint-driven thermal and reliability analysis of Nanometer designs |
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| المؤلفون: | Krishnamoorthy, Srini, Venkatraman, Vishak, Apanovich, Yuri, Burd, Thomas, Daga, Anand |
| المصدر: | 2011 12th International Symposium on Quality Electronic Design Quality Electronic Design (ISQED), 2011 12th International Symposium on. :1-8 Mar, 2011 |
| Relation: | 2011 International Symposium on Quality Electronic Design (ISQED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781612849133 9781612849126 9781612849140 |
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| تدمد: | 19483287 19483295 |
| DOI: | 10.1109/ISQED.2011.5770770 |