مؤتمر
Interconnect reliability assessment of high power Light Emitting Diodes (LEDs) through simulation
| العنوان: | Interconnect reliability assessment of high power Light Emitting Diodes (LEDs) through simulation |
|---|---|
| المؤلفون: | Chang, M.-H., Das, D., Pecht, M. |
| المصدر: | 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on. :418-424 Dec, 2010 |
| Relation: | 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424483440 9781424483433 |
|---|---|
| DOI: | 10.1109/ICRESH.2010.5779586 |