Gate rupture in ultra-thin gate oxides irradiated with heavy ions

التفاصيل البيبلوغرافية
العنوان: Gate rupture in ultra-thin gate oxides irradiated with heavy ions
المؤلفون: Silvestri, M., Gerardin, S., Paccagnella, A., Ghidini, G.
المصدر: 2008 European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on. :107-112 Sep, 2008
Relation: 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781457704819
9781457710360
9781457704826
تدمد:03796566
DOI:10.1109/RADECS.2008.5782694