مؤتمر
Gate rupture in ultra-thin gate oxides irradiated with heavy ions
العنوان: | Gate rupture in ultra-thin gate oxides irradiated with heavy ions |
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المؤلفون: | Silvestri, M., Gerardin, S., Paccagnella, A., Ghidini, G. |
المصدر: | 2008 European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on. :107-112 Sep, 2008 |
Relation: | 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457704819 9781457710360 9781457704826 |
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تدمد: | 03796566 |
DOI: | 10.1109/RADECS.2008.5782694 |