مؤتمر
Degradation in (Ba,Sr)TiO/sub 3/ thin films under DC and dynamic stress conditions
العنوان: | Degradation in (Ba,Sr)TiO/sub 3/ thin films under DC and dynamic stress conditions |
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المؤلفون: | Horikawa, T., Kawahara, T., Yamamuka, M., Ono, K. |
المصدر: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :82-89 1997 |
Relation: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780335759 9780780335752 |
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DOI: | 10.1109/RELPHY.1997.584242 |