Degradation in (Ba,Sr)TiO/sub 3/ thin films under DC and dynamic stress conditions

التفاصيل البيبلوغرافية
العنوان:	Degradation in (Ba,Sr)TiO/sub 3/ thin films under DC and dynamic stress conditions
المؤلفون:	Horikawa, T., Kawahara, T., Yamamuka, M., Ono, K.
المصدر:	1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :82-89 1997
Relation:	1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	0780335759 9780780335752
DOI:	10.1109/RELPHY.1997.584242