An empirical lifetime projection method for laser diode degradation

التفاصيل البيبلوغرافية
العنوان: An empirical lifetime projection method for laser diode degradation
المؤلفون: Nam Hwang, Seung-Goo Kang, Hee-Tae Lee, Seong-Su Park, Min-Kyu Song, Kwang-Eui Pyun
المصدر: 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :272-275 1997
Relation: 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780335759
9780780335752
DOI:10.1109/RELPHY.1997.584272