مؤتمر
An empirical lifetime projection method for laser diode degradation
العنوان: | An empirical lifetime projection method for laser diode degradation |
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المؤلفون: | Nam Hwang, Seung-Goo Kang, Hee-Tae Lee, Seong-Su Park, Min-Kyu Song, Kwang-Eui Pyun |
المصدر: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :272-275 1997 |
Relation: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780335759 9780780335752 |
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DOI: | 10.1109/RELPHY.1997.584272 |