مؤتمر
Key hot-carrier degradation model calibration and verification issues for accurate AC circuit-level reliability simulation
| العنوان: | Key hot-carrier degradation model calibration and verification issues for accurate AC circuit-level reliability simulation |
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| المؤلفون: | Wenjie Jiang, Huy Le, Dao, S., Kim, S.A., Stine, B., Chung, J.E., Yu-Jen Wu, Bendix, P., Prasad, S., Kapoor, A., Kopley, T.E., Dungan, T., Manna, I., Marcoux, P., Lifeng Wu, Chen, A., Zhihong Liu |
| المصدر: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :300-306 1997 |
| Relation: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780335759 9780780335752 |
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| DOI: | 10.1109/RELPHY.1997.584278 |