مؤتمر
New understanding of LDD CMOS hot-carrier degradation and device lifetime at cryogenic temperatures
| العنوان: | New understanding of LDD CMOS hot-carrier degradation and device lifetime at cryogenic temperatures |
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| المؤلفون: | Wang-Ratkovic, J., Lacoe, R.C., MacWilliams, K.P., Miryeong Song, Brown, S., Yabiku, G. |
| المصدر: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual Reliability physics Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International. :312-319 1997 |
| Relation: | 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780335759 9780780335752 |
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| DOI: | 10.1109/RELPHY.1997.584280 |