مؤتمر
Characterization of junction dosage effect on NAND arrays with charge pumping method
العنوان: | Characterization of junction dosage effect on NAND arrays with charge pumping method |
---|---|
المؤلفون: | Lee, Chienying, Lee, C. H., Cheng, C. H., Chong, L. H., Chen, K. F., Chen, Y. J., Huang, J. S., Ku, S. H., Zous, N. K., Huang, I. J., Han, T. T., Chen, M. S., Lu, W. P., Chen, K. C., Wang, Tahui, Lu, Chih-Yuan |
المصدر: | Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on. :1-2 Apr, 2011 |
Relation: | 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424484935 9781424484911 9781424484928 |
---|---|
تدمد: | 1524766X |
DOI: | 10.1109/VTSA.2011.5872269 |