مؤتمر
Characterization of junction dosage effect on NAND arrays with charge pumping method
| العنوان: | Characterization of junction dosage effect on NAND arrays with charge pumping method |
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| المؤلفون: | Lee, Chienying, Lee, C. H., Cheng, C. H., Chong, L. H., Chen, K. F., Chen, Y. J., Huang, J. S., Ku, S. H., Zous, N. K., Huang, I. J., Han, T. T., Chen, M. S., Lu, W. P., Chen, K. C., Wang, Tahui, Lu, Chih-Yuan |
| المصدر: | Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on. :1-2 Apr, 2011 |
| Relation: | 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424484935 9781424484911 9781424484928 |
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| تدمد: | 1524766X |
| DOI: | 10.1109/VTSA.2011.5872269 |