مؤتمر
Endurance Prediction of Scaled NAND Flash Memory Based on Spatial Mapping of Erase Tunneling Current
| العنوان: | Endurance Prediction of Scaled NAND Flash Memory Based on Spatial Mapping of Erase Tunneling Current |
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| المؤلفون: | Fayrushin, Albert, Lee, ChangHyun, Park, Youngwoo, Choi, Jungdal, Choi, Jeonghyuk, Chung, Chilhee |
| المصدر: | 2011 3rd IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2011 3rd IEEE International. :1-4 May, 2011 |
| Relation: | 2011 3rd IEEE International Memory Workshop (IMW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457702242 9781457702259 9781457702266 |
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| تدمد: | 2159483X 21594864 |
| DOI: | 10.1109/IMW.2011.5873215 |