Wet process optimization to deposit conformal Cu diffusion barrier into TSV

التفاصيل البيبلوغرافية
العنوان: Wet process optimization to deposit conformal Cu diffusion barrier into TSV
المؤلفون: Pernel, C., Avale, X., Veillerot, M., Hortemel, L., Leduc, P., Ritzdorf, T.
المصدر: 2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011
Relation: Joint 2011 IEEE International Interconnect Technology Conference (IITC) & 2011 Materials for Advanced Metallization (MAM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781457705038
9781457705014
9781457705021
تدمد:2380632X
23806338
DOI:10.1109/IITC.2011.5940327