مؤتمر
Non-ideal characteristic analysis of GaN-based light-emitting diode using current-voltage (I–V) and low-frequency noise experiment
| العنوان: | Non-ideal characteristic analysis of GaN-based light-emitting diode using current-voltage (I–V) and low-frequency noise experiment |
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| المؤلفون: | Jungjin Park, Taewook Kang, Daeyoung Woo, Joong-Kon Son, Jong-Ho Lee, Byung-Gook Park, Hyungcheol Shin |
| المصدر: | 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-4 Jul, 2011 |
| Relation: | 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457701597 9781457701580 |
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| تدمد: | 19461542 19461550 |
| DOI: | 10.1109/IPFA.2011.5992713 |