دورية أكاديمية
Power Yield Analysis Under Process and Temperature Variations
| العنوان: | Power Yield Analysis Under Process and Temperature Variations |
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| المؤلفون: | Haghdad, K., Anis, M. |
| المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 20(10):1794-1803 Oct, 2012 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10638210 15579999 |
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| DOI: | 10.1109/TVLSI.2011.2163535 |