A novel dual edge triggered near-threshold state retentive latch design

التفاصيل البيبلوغرافية
العنوان: A novel dual edge triggered near-threshold state retentive latch design
المؤلفون: Sriram, Sandeep, Ramani, Arun Ramnath, Nan, Haiqing, Lee, Hojoon, Choi, Ken
المصدر: 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on. :1-4 Aug, 2011
Relation: 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781612848556
9781612848563
9781612848570
تدمد:15483746
15583899
DOI:10.1109/MWSCAS.2011.6026653