دورية أكاديمية
Memory Reliability Model for Accumulated and Clustered Soft Errors
| العنوان: | Memory Reliability Model for Accumulated and Clustered Soft Errors |
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| المؤلفون: | Lee, S., Baeg, S., Reviriego, P. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 58(5):2483-2492 Oct, 2011 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2011.2164555 |