مؤتمر
Improvement of test yield for IC product
| العنوان: | Improvement of test yield for IC product |
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| المؤلفون: | Yuh-Yih Lu, Da-Yuan Lin, Chung-Hsiung Yeh |
| المصدر: | Proceedings of 2011 Cross Strait Quad-Regional Radio Science and Wireless Technology Conference Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC), 2011. 2:1125-1128 Jul, 2011 |
| Relation: | 2011 Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424497928 9781424497911 9781424497935 |
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| DOI: | 10.1109/CSQRWC.2011.6037157 |