مؤتمر
Variability analysis of scaled poly-Si channel FinFETs and tri-gate flash memories for high density and low cost stacked 3D-memory application
| العنوان: | Variability analysis of scaled poly-Si channel FinFETs and tri-gate flash memories for high density and low cost stacked 3D-memory application |
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| المؤلفون: | Liu, Y. X., Mastukawa, T., Endo, K., Oruchi, S., Tsukada, J., Yamauchi, H., Ishikawa, Y., Sakamoto, K., Masahara, M., Kamei, T., Hayashida, T., Ogura, A. |
| المصدر: | 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European. :203-206 Sep, 2011 |
| Relation: | ESSDERC 2011 - 41st European Solid State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457707063 9781457707070 9781457707087 |
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| تدمد: | 19308876 23786558 |
| DOI: | 10.1109/ESSDERC.2011.6044199 |