مؤتمر
28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications
العنوان: | 28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications |
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المؤلفون: | Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.M., Chent, S.J., Chen, K.S., Cheng, J.Y., Tsai, M.H, Chang, W., Chen, R., Chen, C.C., Lee, T.L., Lin, C.K, Yang, S.C., Sheu, Y.M., Tzeng, J.T., Lu, L.C., Jang, S.M, Diaz, C.H., Mii, YJ |
المصدر: | 2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011 |
Relation: | 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457702228 9781457702211 9781457702235 |
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تدمد: | 08865930 21523630 |
DOI: | 10.1109/CICC.2011.6055355 |