28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications

التفاصيل البيبلوغرافية
العنوان:	28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications
المؤلفون:	Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.M., Chent, S.J., Chen, K.S., Cheng, J.Y., Tsai, M.H, Chang, W., Chen, R., Chen, C.C., Lee, T.L., Lin, C.K, Yang, S.C., Sheu, Y.M., Tzeng, J.T., Lu, L.C., Jang, S.M, Diaz, C.H., Mii, YJ
المصدر:	2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011
Relation:	2011 IEEE Custom Integrated Circuits Conference - CICC 2011
قاعدة البيانات:	IEEE Xplore Digital Library