مؤتمر
Nanoanalysis of lanthanum scandate MOS capacitors addressing reliability after local current flow
العنوان: | Nanoanalysis of lanthanum scandate MOS capacitors addressing reliability after local current flow |
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المؤلفون: | Hippler, Markus, Streit, Stephan, Lehmann, Jan, Skorupa, Wolfgang, Helm, Manfred, Schmidt, Heidemarie, Lopes, J. Marcelo Jardao, Schubert, Jurgen, Mantl, Siegfried, Huber, Hans-Peter, Kienberger, Ferry |
المصدر: | 2011 Semiconductor Conference Dresden Semiconductor Conference Dresden (SCD), 2011. :1-3 Sep, 2011 |
Relation: | 2011 Semiconductor Conference Dresden (SCD) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457704314 9781457704291 9781457704307 |
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DOI: | 10.1109/SCD.2011.6068712 |