مؤتمر
Nanoanalysis of lanthanum scandate MOS capacitors addressing reliability after local current flow
| العنوان: | Nanoanalysis of lanthanum scandate MOS capacitors addressing reliability after local current flow |
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| المؤلفون: | Hippler, Markus, Streit, Stephan, Lehmann, Jan, Skorupa, Wolfgang, Helm, Manfred, Schmidt, Heidemarie, Lopes, J. Marcelo Jardao, Schubert, Jurgen, Mantl, Siegfried, Huber, Hans-Peter, Kienberger, Ferry |
| المصدر: | 2011 Semiconductor Conference Dresden Semiconductor Conference Dresden (SCD), 2011. :1-3 Sep, 2011 |
| Relation: | 2011 Semiconductor Conference Dresden (SCD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457704314 9781457704291 9781457704307 |
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| DOI: | 10.1109/SCD.2011.6068712 |