Study of fractal features morphology of surface HEMT GAN heterostructures on foreign substrates

التفاصيل البيبلوغرافية
العنوان: Study of fractal features morphology of surface HEMT GAN heterostructures on foreign substrates
المؤلفون: Torkhov, N. A., Bozhkov, V. G., Novikov, V. A., Ivonin, I. V., Sveshnikov, Yu. N., Tsyplenkov, I. N.
المصدر: 2011 21st International Crimean Conference "Microwave & Telecommunication Technology" Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference. :682-683 Sep, 2011
Relation: 2011 21st International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2011)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781457708831
9789663353562
9789663353579