مؤتمر
Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement
العنوان: | Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement |
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المؤلفون: | Monnereau, N., Caignet, F., Nolhier, N., Tremouilles, D., Bafleur, M. |
المصدر: | 10th International Symposium on Electromagnetic Compatibility EMC Europe 2011 York. :457-463 Sep, 2011 |
Relation: | 2011 International Symposium on Electromagnetic Compatibility - EMC EUROPE |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457717093 9780954114633 |
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تدمد: | 23250356 23250364 |