Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement

التفاصيل البيبلوغرافية
العنوان:	Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement
المؤلفون:	Monnereau, N., Caignet, F., Nolhier, N., Tremouilles, D., Bafleur, M.
المصدر:	10th International Symposium on Electromagnetic Compatibility EMC Europe 2011 York. :457-463 Sep, 2011
Relation:	2011 International Symposium on Electromagnetic Compatibility - EMC EUROPE
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	9781457717093 9780954114633
تدمد:	23250356 23250364