مؤتمر
An internal electrostatic charging test of circuit boards under electron beam
العنوان: | An internal electrostatic charging test of circuit boards under electron beam |
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المؤلفون: | Kim, Wousik, Katz, Ira, Green, Nelson W., Jun, Insoo |
المصدر: | 2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :767-770 Sep, 2011 |
Relation: | 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457705854 9781457705861 |
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تدمد: | 03796566 |
DOI: | 10.1109/RADECS.2011.6131449 |