An internal electrostatic charging test of circuit boards under electron beam

التفاصيل البيبلوغرافية
العنوان: An internal electrostatic charging test of circuit boards under electron beam
المؤلفون: Kim, Wousik, Katz, Ira, Green, Nelson W., Jun, Insoo
المصدر: 2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :767-770 Sep, 2011
Relation: 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781457705854
9781457705861
تدمد:03796566
DOI:10.1109/RADECS.2011.6131449