مؤتمر
Lifetime studies of 130nm nMOS transistors intended for long-duration, cryogenic high-energy physics experiments
العنوان: | Lifetime studies of 130nm nMOS transistors intended for long-duration, cryogenic high-energy physics experiments |
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المؤلفون: | Hoff, J. R., Arora, R., Cressler, J.D., Deptuch, G. W., Gui, P., Lourenco, N.E., Wu, G., Yarema, R. J. |
المصدر: | 2011 IEEE Nuclear Science Symposium Conference Record Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE. :685-693 Oct, 2011 |
Relation: | 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467301183 9781467301190 9781467301206 |
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تدمد: | 10823654 |
DOI: | 10.1109/NSSMIC.2011.6154083 |