مؤتمر
Application of multi-signal modeling theory to testability analysis for complex electronic system
العنوان: | Application of multi-signal modeling theory to testability analysis for complex electronic system |
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المؤلفون: | Haisong Liu, Jiechang Wu, Guojun Chen |
المصدر: | Proceedings of 2011 International Conference on Computer Science and Network Technology Computer Science and Network Technology (ICCSNT), 2011 International Conference on. 2:755-758 Dec, 2011 |
Relation: | 2011 International Conference on Computer Science and Network Technology (ICCSNT) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457715860 9781457715853 9781457715877 |
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DOI: | 10.1109/ICCSNT.2011.6182074 |