مؤتمر
DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
| العنوان: | DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM |
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| المؤلفون: | Singhee, Amith, Acar, Emrah, Younus, Mohammad I., Singh, Rama N., Bansal, Aditya |
| المصدر: | Thirteenth International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2012 13th International Symposium on. :470-476 Mar, 2012 |
| Relation: | 2012 13th International Symposium on Quality Electronic Design (ISQED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467310345 9781467310352 9781467310369 |
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| تدمد: | 19483287 19483295 |
| DOI: | 10.1109/ISQED.2012.6187535 |