مؤتمر
Embedded SRAM ring oscillator for in-situ measurement of NBTI and PBTI degradation in CMOS 6T SRAM array
| العنوان: | Embedded SRAM ring oscillator for in-situ measurement of NBTI and PBTI degradation in CMOS 6T SRAM array |
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| المؤلفون: | Ming-Chien Tsai, Yi-Wei Lin, Hao-I Yang, Ming-Hsien Tu, Wei-Chiang Shih, Nan-Chun Lien, Kuen-Di Lee, Shyh-Jye Jou, Chuang, Ching-Te, Wei Hwang |
| المصدر: | Proceedings of Technical Program of 2012 VLSI Design, Automation and Test VLSI Design, Automation, and Test (VLSI-DAT), 2012 International Symposium on. :1-4 Apr, 2012 |
| Relation: | 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457720802 9781457720796 9781457720819 |
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| DOI: | 10.1109/VLSI-DAT.2012.6212587 |