مؤتمر
A characterization tool for current degradation effects of abnormally structured MOS transistors
| العنوان: | A characterization tool for current degradation effects of abnormally structured MOS transistors |
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| المؤلفون: | Jin-Kyu Park, Chang-Hoon Choi, Young-Kwan Park, Chang-Sub Lee, Jeong-Taek Kong, Moon-Ho Kim, Kyung-Ho Kim, Taek-Soo Kim, Sang-Hoon Lee |
| المصدر: | SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on. :41-43 1997 |
| Relation: | SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780337751 9780780337756 |
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| DOI: | 10.1109/SISPAD.1997.621331 |