مؤتمر
A Investigation of E/W Cycle Characteristics for 2y-nm MLC NAND Flash Memory Devices
| العنوان: | A Investigation of E/W Cycle Characteristics for 2y-nm MLC NAND Flash Memory Devices |
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| المؤلفون: | Jeong, YeonJoo, Lee, Sangjo, Cho, Sunghoon, Kim, Pyunghwa, Park, Milim, Lee, SungPyo, Shim, Hyunyoung, Cho, Myoung Kwan, Ahn, Kun-Ok, Bae, Gihyun, Park, Sungwook |
| المصدر: | 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-3 May, 2012 |
| Relation: | 2012 4th IEEE International Memory Workshop (IMW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467310796 9781467310819 |
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| تدمد: | 2159483X 21594864 |
| DOI: | 10.1109/IMW.2012.6213619 |