مؤتمر
An Investigation of Abnormal Program Phenomena with S/D Junctions and Dopant Profiles for Sub-20 nm NAND Flash Memory Devices
| العنوان: | An Investigation of Abnormal Program Phenomena with S/D Junctions and Dopant Profiles for Sub-20 nm NAND Flash Memory Devices |
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| المؤلفون: | Park, Byoungjun, Cho, Sunghoon, Park, Jiyul, Kim, Pyunghwa, Lee, Sangjo, Park, Milim, Park, Min Sang, Park, Sukkwang, Yang, Hae Chang, Park, Sungjo, Lee, Yunbong, Cho, Myoung Kwan, Ahn, Kun-Ok, Bae, Gihyun, Park, Sungwook |
| المصدر: | 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012 |
| Relation: | 2012 4th IEEE International Memory Workshop (IMW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467310796 9781467310819 |
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| تدمد: | 2159483X 21594864 |
| DOI: | 10.1109/IMW.2012.6213622 |