مؤتمر
Memory reliability improvements based on maximized error-correcting codes
| العنوان: | Memory reliability improvements based on maximized error-correcting codes |
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| المؤلفون: | Gherman, Valentin, Evain, Samuel, Bonhomme, Yannick |
| المصدر: | 2012 17th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2012 17th IEEE European. :1-6 May, 2012 |
| Relation: | 2012 17th IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467306959 9781467306966 9781467306973 |
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| تدمد: | 15301877 15581780 |
| DOI: | 10.1109/ETS.2012.6233018 |