مؤتمر
Experimental confirmation of electron fluence driven, Cu catalyzed interface breakdown model for low-k TDDB
| العنوان: | Experimental confirmation of electron fluence driven, Cu catalyzed interface breakdown model for low-k TDDB |
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| المؤلفون: | Chen, Fen, Gambino, Jeffrey, Shinosky, Michael, Aitken, John, Huang, Elbert, Cohen, Stephan, Yang, Chih-Chao, Edelstein, Dan, Wang, Yun, Kane, Terry, Kioussis, Dimitri |
| المصدر: | 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :3A.3.1-3A.3.9 Apr, 2012 |
| Relation: | 2012 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457716799 9781457716782 9781457716805 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2012.6241802 |