The impact of melting during reset operation on the reliability of phase change memory

التفاصيل البيبلوغرافية
العنوان:	The impact of melting during reset operation on the reliability of phase change memory
المؤلفون:	Du, Pei-Ying, Wu, Jau-Yi, Hsu, Tzu-Hsuan, Lee, Ming-Hsiu, Wang, Tien-Yen, Cheng, Huai-Yu, Lai, Erh-Kun, Lai, Sheng-Chih, Lung, Hsiang-Lan, Kim, SangBum, BrightSky, Matthew J., Zhu, Yu, Mittal, Surbhi, Cheek, Roger, Raoux, Simone, Joseph, Eric A., Schrott, Alejandro, Li, Jing, Lam, Chung
المصدر:	2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :6C.2.1-6C.2.6 Apr, 2012
Relation:	2012 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library