مؤتمر
The impact of melting during reset operation on the reliability of phase change memory
العنوان: | The impact of melting during reset operation on the reliability of phase change memory |
---|---|
المؤلفون: | Du, Pei-Ying, Wu, Jau-Yi, Hsu, Tzu-Hsuan, Lee, Ming-Hsiu, Wang, Tien-Yen, Cheng, Huai-Yu, Lai, Erh-Kun, Lai, Sheng-Chih, Lung, Hsiang-Lan, Kim, SangBum, BrightSky, Matthew J., Zhu, Yu, Mittal, Surbhi, Cheek, Roger, Raoux, Simone, Joseph, Eric A., Schrott, Alejandro, Li, Jing, Lam, Chung |
المصدر: | 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :6C.2.1-6C.2.6 Apr, 2012 |
Relation: | 2012 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!