مؤتمر
Reliability study under DC stress on mmW LNA, Mixer and VCO
| العنوان: | Reliability study under DC stress on mmW LNA, Mixer and VCO |
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| المؤلفون: | Ighilahriz, S., Cacho, F., Moquillon, L., Razafimandimby, S., Blanchet, F., Morelle, J., Corrao, N., Huard, V., Garcia, P., Arnaud, C., Fournier, J.M., Benech, P. |
| المصدر: | 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :CR.4.1-CR.4.5 Apr, 2012 |
| Relation: | 2012 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457716799 9781457716782 9781457716805 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2012.6241889 |