مؤتمر
Effects of gate process on NBTI characteristics of TiN gate FinFET
العنوان: | Effects of gate process on NBTI characteristics of TiN gate FinFET |
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المؤلفون: | Kim, Jin Ju, Moonju Cho, Pantisano, Luigi, Chiarella, Thomas, Togo, Mitsuhiro, Horiguchi, Naoto, Groeseneken, Guido, Lee, Byoung Hun |
المصدر: | 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :GD.6.1-GD.6.4 Apr, 2012 |
Relation: | 2012 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457716799 9781457716782 9781457716805 |
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تدمد: | 15417026 19381891 |
DOI: | 10.1109/IRPS.2012.6241913 |