دورية أكاديمية
Characterization of Channel-Diameter-Dependent Low-Frequency Noise in Silicon Nanowire Field-Effect Transistors
| العنوان: | Characterization of Channel-Diameter-Dependent Low-Frequency Noise in Silicon Nanowire Field-Effect Transistors |
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| المؤلفون: | Lee, S.-H., Baek, C.-K., Park, S., Kim, D.-W., Sohn, D. K., Lee, J.-S., Kim, D. M., Jeong, Y.-H. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(10):1348-1350 Oct, 2012 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2012.2209625 |