دورية أكاديمية
On the Contribution of Bulk Defects on Charge Pumping Current
| العنوان: | On the Contribution of Bulk Defects on Charge Pumping Current |
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| المؤلفون: | Ryan, J. T., Southwick, R. G., Campbell, J. P., Cheung, K. P., Suehle, J. S. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(11):2943-2949 Nov, 2012 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2012.2211880 |