مؤتمر
Laser voltage probing in failure analysis of advanced integrated circuits on SOI
| العنوان: | Laser voltage probing in failure analysis of advanced integrated circuits on SOI |
|---|---|
| المؤلفون: | Ravikumar, V. K., Wampler, R., Ho, M. Y., Christensen, J., Phoa, S. L. |
| المصدر: | 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-4 Jul, 2012 |
| Relation: | 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467309806 9781467309820 9781467309837 |
|---|---|
| تدمد: | 19461542 19461550 |
| DOI: | 10.1109/IPFA.2012.6306297 |