مؤتمر
Infrared dielectric functions of hydrogenated amorphous silicon thin films determined by spectroscopic ellipsometry
| العنوان: | Infrared dielectric functions of hydrogenated amorphous silicon thin films determined by spectroscopic ellipsometry |
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| المؤلفون: | John, David B. Saint, Shen, Haoting, Shin, Hang-Beum, Jackson, Thomas N., Podraza, Nikolas J. |
| المصدر: | 2012 38th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE. :003112-003117 Jun, 2012 |
| Relation: | 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467300643 9781467300650 9781467300667 |
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| تدمد: | 01608371 |
| DOI: | 10.1109/PVSC.2012.6318239 |