دورية أكاديمية
Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers
| العنوان: | Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers |
|---|---|
| المؤلفون: | Lim, S. Y., Forster, M., Zhang, X., Holtkamp, J., Schubert, M. C., Cuevas, A., Macdonald, D. |
| المصدر: | IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 3(2):649-655 Apr, 2013 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21563381 21563403 |
|---|---|
| DOI: | 10.1109/JPHOTOV.2012.2228301 |