Differential Scan Attack on AES with X-tolerant and X-masked Test Response Compactor

التفاصيل البيبلوغرافية
العنوان: Differential Scan Attack on AES with X-tolerant and X-masked Test Response Compactor
المؤلفون: Ege, Baris, Das, Amitabh, Gosh, Santosh, Verbauwhede, Ingrid
المصدر: 2012 15th Euromicro Conference on Digital System Design Digital System Design (DSD), 2012 15th Euromicro Conference on. :545-552 Sep, 2012
Relation: 2012 15th Euromicro Conference on Digital System Design (DSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467324984
9780769547985
DOI:10.1109/DSD.2012.44