دورية أكاديمية
Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment
| العنوان: | Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment |
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| المؤلفون: | Shi, L., Nihtianov, S., Nanver, L. K., Scholze, F. |
| المصدر: | IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 13(5):1699-1707 May, 2013 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 1530437X 15581748 23799153 |
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| DOI: | 10.1109/JSEN.2012.2235142 |