مؤتمر
Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application
| العنوان: | Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application |
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| المؤلفون: | Shi, L., Nihtianov, S. N., Scholze, F., Nanver, L. K. |
| المصدر: | IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society. :3952-3957 Oct, 2012 |
| Relation: | IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467324205 9781467324199 9781467324212 |
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| تدمد: | 1553572X |
| DOI: | 10.1109/IECON.2012.6389260 |