مؤتمر
Guided-probe diagnosis of macro-cell-designed LSI circuits
| العنوان: | Guided-probe diagnosis of macro-cell-designed LSI circuits |
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| المؤلفون: | Kuji, N. |
| المصدر: | Proceedings Sixth Asian Test Symposium (ATS'97) Test symposium Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian. :174-179 1997 |
| Relation: | Proceedings Sixth Asian Test Symposium (ATS'97) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818682094 9780818682094 |
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| تدمد: | 10817735 |
| DOI: | 10.1109/ATS.1997.643955 |