مؤتمر
Simulation study of dimensional effect on bipolar resistive random access memory (RRAM)
العنوان: | Simulation study of dimensional effect on bipolar resistive random access memory (RRAM) |
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المؤلفون: | Kai, Liu, Kailiang, Zhang, Fang, Wang, Jinshi, Zhao, Jun, Wei |
المصدر: | 2013 IEEE 5th International Nanoelectronics Conference (INEC) Nanoelectronics Conference (INEC), 2013 IEEE 5th International. :306-308 Jan, 2013 |
Relation: | 2013 IEEE International Nanoelectronics Conference (INEC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467348416 9781467348409 9781467348423 |
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تدمد: | 21593523 21593531 |
DOI: | 10.1109/INEC.2013.6466031 |