مؤتمر
The Effect of Gate Dielectric Al2O3/ZnO on Interface Quality with N-GaAs
العنوان: | The Effect of Gate Dielectric Al2O3/ZnO on Interface Quality with N-GaAs |
---|---|
المؤلفون: | Chen, Liu, Zhang, Yu-Ming, Lu, Hong-Liang, Zhang, Yi-Men |
المصدر: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on. :1-3 Oct, 2012 |
Relation: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467324748 9781467324731 9781467324755 |
---|---|
DOI: | 10.1109/ICSICT.2012.6467640 |