The Effect of Gate Dielectric Al2O3/ZnO on Interface Quality with N-GaAs

التفاصيل البيبلوغرافية
العنوان: The Effect of Gate Dielectric Al2O3/ZnO on Interface Quality with N-GaAs
المؤلفون: Chen, Liu, Zhang, Yu-Ming, Lu, Hong-Liang, Zhang, Yi-Men
المصدر: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on. :1-3 Oct, 2012
Relation: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467324748
9781467324731
9781467324755
DOI:10.1109/ICSICT.2012.6467640