مؤتمر
Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes
| العنوان: | Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes |
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| المؤلفون: | Garcia, H., Castan, H., Duenas, S., Bailon, L., Feijoo, P. C., Pampillon, M. A., Andres, E. San |
| المصدر: | 2013 Spanish Conference on Electron Devices Electron Devices (CDE), 2013 Spanish Conference on. :285-288 Feb, 2013 |
| Relation: | 2013 Spanish Conference on Electron Devices (CDE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467346672 9781467346665 9781467346689 |
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| تدمد: | 21634971 |
| DOI: | 10.1109/CDE.2013.6481398 |