مؤتمر
Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques
| العنوان: | Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques |
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| المؤلفون: | Martinez, O., Moralejo, B., Hortelano, V., Tejero, A., Gonzalez, M. A., Jimenez, J., Mass, J., Parra, V. |
| المصدر: | 2013 Spanish Conference on Electron Devices Electron Devices (CDE), 2013 Spanish Conference on. :361-364 Feb, 2013 |
| Relation: | 2013 Spanish Conference on Electron Devices (CDE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467346672 9781467346665 9781467346689 |
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| تدمد: | 21634971 |
| DOI: | 10.1109/CDE.2013.6481417 |