مؤتمر
Grain boundary-related kink effects of poly-Si TFTs
| العنوان: | Grain boundary-related kink effects of poly-Si TFTs |
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| المؤلفون: | Liu, T.C., Kuo, J. B. |
| المصدر: | 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on. :1-2 Dec, 2012 |
| Relation: | 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467356947 9781467356954 9781467356961 |
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| DOI: | 10.1109/EDSSC.2012.6482891 |